Thermal conductivity testing equipment

Time-resolved thermal reflectivity (TDTR) is an optical pump-probe technique. In this technique, a pump beam thermally excites the sample surface, while a probe beam measures the time-resolved thermal reflectivity of bulk materials, nanostructures, and thin films. The principle is as follows: an ultrafast pulsed laser heats the material under test, causing changes in its surface temperature and reflectivity. A second pulsed laser with adjustable delay time then probes the actual changes in the material's surface reflectivity. The experimental data is compared with theoretically calculated data, and the differences are minimized by adjusting the parameters of the theoretical model, thereby accurately obtaining the material's thermal properties and hot carrier heat dissipation characteristics. Because TDTR is a non-contact thermal conductivity measurement method based on femtosecond ultrafast laser pump-probe technology, it is currently a unique technique that can simultaneously measure the thermal conductivity and interfacial thermal resistance of nanofilms compared to other thermal conductivity measurement techniques. It has advantages such as fewer influencing factors, smaller required sample size, and high data accuracy.